May 02, 2026
This chapter will discuss the Secondary Ion Mass Spectrometry (SIMS) technique for the new SIMS user, illustrating how SIMS fits in with other common surface analytical techniques.
Jan 29, 2026
Elucidating atomic emission and molecular absorption spectra using a basic CD spectrometer: a pedagogical approach for secondary-level students
Jun 21, 2026
SIMS instruments use an internally generated beam of either positive (e.g., C) or negative (e.g., O) ions (primary beam) focused on a sample surface to generate ions that are then transferred into a mass
Mar 04, 2026
This paper demonstrates how secondary electron energy spectroscopy (SEES) performed inside a scanning electron microscope (SEM) can be used to map sample atomic number
Jul 04, 2026
Spectrometers for Elemental Spectrochemical Analysis, Part I: The Basic Spectrometer An overview of the instrumentation used in elemental spectrochemical analysis. A spectrometer consists
Dec 12, 2025
The trajectories taken by secondary ions in the mass spectrometer are controlled by their velocity v, (kinetic energy E K), and the angle at which they emerge from the sample.
Nov 29, 2025
Infrared Spectroscopy Primary and secondary amines can be identified by a characteristic N–H stretching absorption in the 3300 to 3500 cm –1 range of the
May 30, 2026
Nanoscale infrared spectroscopy (AFMIR) is becoming an important tool for the analysis of biological sample, in particular protein assemblies, at the
Jul 06, 2026
Expand/collapse global hierarchy Home Campus Bookshelves Athabasca University Chemistry 360: Organic Chemistry II Chapter 17: Alcohols and Phenols 17.11
Apr 22, 2026
Mass spectrometry, analytic technique by which chemical substances are identified by the sorting of gaseous ions in electric and magnetic
Jun 22, 2026
The second part brie y introduces the HySpex airborne sensor system that our institute owns and operates. Further, a short explanation on the working principle of a pushbroom spectrometer is
Jan 30, 2026
The Spectrum Two N spectrometer is supplied with a USB 2.0 cable and a mains power supply adaptor with a DC connector (Figure 9). The mains power cord
Aug 30, 2025
IR-spectroscopy is perhaps the most frequently used technique in the organic chemistry labs at PSU. It is routinely used to identify products and to verify that
Apr 19, 2026
A final technique in structure elucidation is mass spectrometry, which allows us to measure the mass of an ion via a mass-to-charge (m/ z) ratio. The basic
Feb 19, 2026
Grating Spectrometer The Instrument A grating spectrometer is in every way similar to a prism spectrometer (such as the type shown in Figure 1) with the exception
Mar 10, 2026
Ions generated by this process form the secondary beam and are subsequently transmitted within a continuous high vacuum environment to a
Jan 11, 2026
Secondary ions are collected and detected by a mass spectrometer. If the primary ion beam is focused and scanned across the surface, the resulting mass-to-charge ratio (m/z) signals can be...
Mar 21, 2026
Home Molecular Spectroscopy Fourier Transform (FT) Infrared (IR) and Near Infrared (NIR) Nicolet Spectrometers Nicolet iS50 Spectrometer 269
Jan 22, 2026
5. Electron Detectors and Spectrometers The most effective detection systems for secondary electrons (SE), which has a low noise level and a large bandwidth, is the Everhart-Thornley detector. Electrons
Jul 23, 2025
Secondary ion mass spectroscopy (SIMS) is an ion beam analysis technique useful for characterising the top few micrometres of samples. Primary ions of energy 0.5–20 keV, commonly O + 2, Cs +, Ar
Aug 07, 2025
In this article, we take a look at the fundamentals of mass spectrometry, how it works, variations that can be used at each stage of the
May 12, 2026
This page discusses Secondary Ion Mass Spectrometry (SIMS), a highly sensitive technique for detecting impurity elements at low concentrations. It describes the
Jul 25, 2025
The purpose of this transfer lens is to form a real magnified image of the sample surface at the position of the field aperture and to focus the secondary ion beam onto the entrance slit of the spectrometer.
Oct 28, 2025
Secondary Ion Mass Spectrometer Laboratory The SIMS laboratory of IGGCAS houses three ion microprobes, namely the CAMECA IMS1280, IMS1280HR, and NanoSIMS 50L.
Dec 16, 2025
Recent years have seen a huge progress in the development of phase-sensitive second-order laser spectroscopy which has proven to be a very powerful tool for the investigation of
Dec 26, 2025
Secondary ion mass spectrometry (SIMS) is a sophisticated and powerful analytical technique to characterise the surface and sub-surface of materials. It has been widely used in
Jan 09, 2026
The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface to a depth of 1 to 2 nm.
Feb 21, 2026
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